Thin film Thickness Measurement System
Quantity: In Stock
Category: Manual Measuring Equipment
Business & Industrial > Science & Laboratory > Laboratory Equipment > Microscopes
Quick Overview:
Equipment : Thin Film Thickness Measurement System with Microscope
Brand : MPO, USA
P/N : MP100-ME
Leader in Low cost optical spectrometer solution for thin film measurement.
Brand : MPO, USA
P/N : MP100-ME
Leader in Low cost optical spectrometer solution for thin film measurement.
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- Come standard with a microscope.
- It provides state-of-the-art functions to measure such materials as filled cell gap on LCD, polyimide on ITO, color filter CIE chromaticity, and color filter thickness.
- It also able to measure common materials like Oxide, Nitride, Photoresist and Polysilicon films.
- The powerful software algorithms can perform single, double, and triple layer thickness calculations.
- Scanning Range : 380nm to 950nm, standard
- Optional Range : The option exists for different scanning ranges depending on different gratings chosen, such as : 200-575 nm, 250-800 nm, 530-1000 nm, 200-450 nm, or the combination of these gratings can provide a scanning range from 200-1000 nm
- Spectrum Resolution : 2 nm
- Precision : 0.1 nm
- Measurement Speed : 2 sec.
- Measurement Spot Size : Varies by Magnification; 50 microns at 5x magnification, 25 microns at 10x magnification, and 7 microns at 40x magnification
- For greater precision, inquire about Custom Built Unit
- Viewing Methods : 2.7'' inches wide video view screen and regular trinocular microscope lens can be used to view the measurement spot.
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Thin film Thickness Measurement System
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