Thin Film Thickness Measurement System
Quantity: In Stock
Category: Manual Measuring Equipment
Business & Industrial > Science & Laboratory > Laboratory Equipment > Microscopes
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Equipment : Thin Film Thickness Measurement System
Brand : MPO, USA
P/N : MP100-ST
Leader in low cost optical spectrometer solution for thin film measurement.
Brand : MPO, USA
P/N : MP100-ST
Leader in low cost optical spectrometer solution for thin film measurement.
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- Comes standard with a portable spectrometer, an optical probe mounted on a manual X-Y stage, and a notebook computer installed with Measurement software.
- Software contains hundreds of pre-loaded film recipes with the ability to create and edit new ones.
- The system measures Oxide, Nitride, Photoresist, Polysilicon, CIE chromaticity, cell gap, color filter, and polyimide/ITO Thickness, etc.
- Scanning Range : 380nm to 950nm, standard
- Optional Range : It is optional to choose different gratings for different ranges of scanning, such as: 200-575, 250-800, 530-1000, 200-450, the combination of the range can add up the range from 200 nm to 1000 nm
- Spectrum Resolution :2 nm
- Precision : 0.1 nm
- Measurement Speed : 2 sec.
- Measurement Spot : 3 to 5 mm diameter
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Thin Film Thickness Measurement System
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