Equipment : Thin Film Thickness Measurement System
Brand : MPO, USA
P/N : MP100-ST
Leader in low cost optical spectrometer solution for thin film measurement.
Comes standard with a portable spectrometer, an optical probe mounted on a manual X-Y stage, and a notebook computer installed with Measurement software.
Software contains hundreds of pre-loaded film recipes with the ability to create and edit new ones.
The system measures Oxide, Nitride, Photoresist, Polysilicon, CIE chromaticity, cell gap, color filter, and polyimide/ITO Thickness, etc.
Scanning Range : 380nm to 950nm, standard
Optional Range : It is optional to choose different gratings for different ranges of scanning, such as: 200-575, 250-800, 530-1000, 200-450, the combination of the range can add up the range from 200 nm to 1000 nm
Spectrum Resolution :2 nm
Precision : 0.1 nm
Measurement Speed : 2 sec.
Measurement Spot : 3 to 5 mm diameter
Sorry, Currently No Video Uploaded.
Sorry, Currently No File Uploaded.
Thin Film Thickness Measurement System
Please Leave Your Product Enquiry Here. We will Get Back To You Soon.